This article talks about SEE [1] in complex devices. It mainly focuses on Single Event Burnout (SEB) in power MOSFETs and also touches on Single Event Upset (SEU) and Single Event Functional Interrupt (SEFI) in FPGAs. SEB in power MOSFETs is always accompanied by melting of metal layers on the...

* Impact of laser pulse duration to induce Single Event Upset (SEU) * Pulsed lasers have proven to be a very economical and fast alternative to testing Single Event Effect as compared to radiation sources. When it comes to inducing the Single Event Upset by pulsed lasers in semiconductor devices,...

Understanding the Single Event Effect (SEE** * Space-born instruments carry many electronic devices including micro-processors, registers in digital circuits, etc. If a charged particle from space, strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This article intends to explain this issue....