Rez Mani Single Event Effect (SEE) in complex devices This article talks about SEE [1] in complex devices. It mainly focuses on Single Event Burnout (SEB) in power MOSFETs and also touches on Single Event Upset (SEU) and Single Event Functional Interrupt (SEFI) in FPGAs. SEB in power MOSFETs is always accompanied by melting of metal layers on the... Single Event Effect (SEE) Aug 17, 2020
Rez Mani UVC lamp safety measures UV disinfecting lamps have been the hot topic these days in the fight against COVID-19. Many hospitals and long term care facilities have been using UVC [1] disinfecting lamps in the form of upper room germicidal UV lamps [2] (GUV), in ducts, stationary units or mobile robotics units to disinfect... Allied Scientific Medical Blogs Lighting Passport Blogs Aug 7, 2020