RADECS, Gothenburg

09/16/2018 13:01 to 09/21/2018 13:01 (America/Montreal)

Gothenburg, Sweden

  


  Host: Rez Mani did a M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a PhD in satellite optical instrumentation from York University. After working in industry for 10 years where he worked in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.

Webinar Description: Space-born instruments carry many electronic components such as FPGAs, ADCs, shift registers, SRAMs, DRAMs operation amplifiers, etc. If a space particle strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for the cross section of the SEE, it is expensive and can only be done in localized test centers. The laser testing of SEE using pulsed lasers of typically nano-Joules pulse energy is much easier to set up and can be done at any location. The laser beam can be focused on the Device Under Test (DUT) using a microscope objective to a spot of the order of few microns and probe different regions of the device with high resolution for occurrence of SEE. Although the absolute cross sections cannot be measured using the laser testing technique, it is assumed that the relative differences between the particle method and the laser method remain the same. Once the calibration is done in a particle testing facility, all the subsequent measurements can be done using the laser method. Therefore the laser method is a complementary method to the particle method and it is not meant to replace it. The webinar also shows a few case studies of laser SEE testing of electronic components as examples. 

Once you are registered you will be receiving a Gotomeeting or webex link and code to get in the webinar, stay tuned!  If you have any questions feel free to email ricky@alliedscientificpro.com.

Website: http://www.radecs2018.org/index.htm

About: The aim of RADECS conferences is to provide an annual European forum for the presentation and discussion of the latest advances in the field of radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems. The scope of the conference encompasses technological processes and design techniques for producing radiation tolerant systems for space, aeronautical or terrestrial applications, as well as relevant methodologies for their characterization and qualification.

Booth: 24

What: Workstation for Laser Testing of Single Events Effects (SEE) on Radiation Hardened Semiconductor Devices 

Where: The Swedish Exhibition & Congress Centre/Gothia Towers, Gothenburg, Sweden

When: September 16th - September 21st, 2018

             
           

Where

Swedish Exhibition and Congress Centre
Mässans Gata/Korsvägen
    Gothenburg 412 94
    Sweden

When

From 09/16/2018 13:01
To 09/21/2018 13:01

Organizer

Allied Scientific Pro
+1-800-253-4107
+1-(866) 526-4086

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