SEE/Military and Aerospace Programmable Logic Devices (MAPLD) Workshop

05/21/2018 13:28 to 05/24/2018 13:28 (America/Montreal)

La Jolla, United States

  


  Host: Rez Mani did a M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a PhD in satellite optical instrumentation from York University. After working in industry for 10 years where he worked in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.

Webinar Description: Space-born instruments carry many electronic components such as FPGAs, ADCs, shift registers, SRAMs, DRAMs operation amplifiers, etc. If a space particle strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for the cross section of the SEE, it is expensive and can only be done in localized test centers. The laser testing of SEE using pulsed lasers of typically nano-Joules pulse energy is much easier to set up and can be done at any location. The laser beam can be focused on the Device Under Test (DUT) using a microscope objective to a spot of the order of few microns and probe different regions of the device with high resolution for occurrence of SEE. Although the absolute cross sections cannot be measured using the laser testing technique, it is assumed that the relative differences between the particle method and the laser method remain the same. Once the calibration is done in a particle testing facility, all the subsequent measurements can be done using the laser method. Therefore the laser method is a complementary method to the particle method and it is not meant to replace it. The webinar also shows a few case studies of laser SEE testing of electronic components as examples. 

Once you are registered you will be receiving a Gotomeeting or webex link and code to get in the webinar, stay tuned!  If you have any questions feel free to email ricky@alliedscientificpro.com.

Website: https://www.seemapld.org/

About: The Single Event Effects (SEE)/Military and Aerospace Programmable Logic Devices (MAPLD) Workshop allows you to educate and network with various industry leaders. Cobham Semiconductor Solutions, Allied Scientific Pro, Ultra TEC, Renesas, 4Links Limited, NanoXplore, 3D Plus, EMPC, Cryptology Research Inc, New Wave Design & Verification, OneSpin, NASA, National Reconnaissance Office, Microsemi Corporation, Mentor, and Achronix Semiconductor Corporation will all be on display. 

Booth: 12

What: Workstation for Laser Testing of Single Events Effects (SEE) on Radiation Hardened Semiconductor Devices  

Where: San Diego, California at the La Jolla Marriott 

When: May 21-24, 2018


Where

Marriot La Jolla
4240 La Jolla Village Dr
    La Jolla, CA 92037
    United States

When

From 05/21/2018 13:28
To 05/24/2018 13:28

Organizer

Allied Scientific Pro
+1-800-253-4107
+1-(866) 526-4086

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