Waste Management Symposia

03/03/2019 09:00 to 03/07/2019 17:00 (America/Montreal)

Phoenix, United States

  


  Host: Rez Mani did a M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a PhD in satellite optical instrumentation from York University. After working in industry for 10 years where he worked in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.

Webinar Description: Space-born instruments carry many electronic components such as FPGAs, ADCs, shift registers, SRAMs, DRAMs operation amplifiers, etc. If a space particle strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for the cross section of the SEE, it is expensive and can only be done in localized test centers. The laser testing of SEE using pulsed lasers of typically nano-Joules pulse energy is much easier to set up and can be done at any location. The laser beam can be focused on the Device Under Test (DUT) using a microscope objective to a spot of the order of few microns and probe different regions of the device with high resolution for occurrence of SEE. Although the absolute cross sections cannot be measured using the laser testing technique, it is assumed that the relative differences between the particle method and the laser method remain the same. Once the calibration is done in a particle testing facility, all the subsequent measurements can be done using the laser method. Therefore the laser method is a complementary method to the particle method and it is not meant to replace it. The webinar also shows a few case studies of laser SEE testing of electronic components as examples. 

Once you are registered you will be receiving a Gotomeeting or webex link and code to get in the webinar, stay tuned!  If you have any questions feel free to email ricky@alliedscientificpro.com.

About: The annual Waste Management (WM) Conference, presented by WM Symposia (WMS), attracts thousands of registrants from around the world and is widely regarded as the premier international conference for the management of radioactive material and related topics. If you are an influencer in the industry, then WM Symposia is where you need to be.

This truly is a unique opportunity for the industry. Here are just a few reasons to attend:

  • The annual Waste Management Symposium is the world’s largest and most prestigious conference on radioactive waste management & disposal, decommissioning, packaging & transportation, facility siting and site remediation.
  • You can network and connect with over 2,000 industry specialists and managers from more than 35 countries.
  • You can learn about trends and developments from the most senior industry managers.
  • You can be informed of the products and services of the world’s leading companies in the exhibit hall, including a new program for product demonstration.
  • You can hear about technology development and project accomplishments at technical presentations and panel sessions.
  • There are many opportunities to network and interact with your colleagues.
  • Several procurement and contracting sessions will feature upcoming business opportunities that you can learn about.
  • You can further your professional credentials by attending Sunday training workshops

Booth: 535

What: Laser Cleaning System

Where: Phoenix Convention Center, Phoenix, Arizona, USA

Where

Phoenix Convention Center
100 N 3rd St
    Phoenix, AZ 85004
    United States

When

From 03/03/2019 09:00
To 03/07/2019 17:00

Organizer

Allied Scientific Pro
+1-800-253-4107
+1-(866) 526-4086

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