Webinar Laser testing of Single Event Effects (SEE) and Case Studies
09/25/2019 14:00 to 09/25/2019 15:00 (Canada/Eastern)
Rez Mani did an M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a Ph.D. in Earth and Space Science focused on satellite optical instrumentation from York University in Toronto, Ontario. After working in the industry for 10 years where he participated in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.
The level 2 photometry webinar builds on the concepts of the level 1 webinar. It contains a photometry section that discusses photometric quantities such as luminous intensity, luminous power, illuminance, and luminance. A few example problems which involve these quantities are solved. The webinar also contains a colorimetry section that shows more TM30-18 graphical examples for real-life sources. It also discusses Annex E which is a set of recommendations by IES for specifying the light source color rendition.Once you are registered you will be receiving a Gotomeeting or WebEx link and code to get in the webinar, stay tuned! If you have any questions feel free to email firstname.lastname@example.org.
Host: Rez Mani did a M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a PhD in satellite optical instrumentation from York University. After working in industry for 10 years where he worked in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.
Webinar Description: Space-born instruments carry many electronic components such as FPGAs, ADCs, shift registers, SRAMs, DRAMs and operation amplifiers. If a space particle strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for cross section of the SEE, it is expensive and can only be done in localized test centers. The laser testing of SEE using pulsed lasers of typically nano-Joules pulse energy is much easier to set up and can be done at any location. The laser beam can be focused on the Device Under test (DUT) using a microscope objective to a spot of the order of one micron and probe different regions of the device with high resolution for occurrence of SEE. Although the absolution cross sections cannot be measured using the laser testing technique, it is assumed that the relative differences between the particle method and the laser method remain the same. Once the calibration is done in a particle testing facility, all the subsequent measurements can be done using the laser method. Therefore the laser method is a complementary method to the particle method and it is not meant to replace it. The webinar also shows a few case studies of laser SEE testing of electronic components as examples.