Webinar Level 1 - Introducing Laser Testing of Single Event Effect(SEE)
08/22/2018 14:00 to 08/22/2018 15:00 (America/Montreal)
Host: Rez Mani did a M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a PhD in satellite optical instrumentation from York University. After working in industry for 10 years where he worked in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.
Webinar Description: Space-born instruments carry many electronic components such as FPGAs, ADCs, shift registers, SRAMs, DRAMs operation amplifiers, etc. If a space particle strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for the cross section of the SEE, it is expensive and can only be done in localized test centers. The laser testing of SEE using pulsed lasers of typically nano-Joules pulse energy is much easier to set up and can be done at any location. The laser beam can be focused on the Device Under Test (DUT) using a microscope objective to a spot of the order of few microns and probe different regions of the device with high resolution for occurrence of SEE. Although the absolute cross sections cannot be measured using the laser testing technique, it is assumed that the relative differences between the particle method and the laser method remain the same. Once the calibration is done in a particle testing facility, all the subsequent measurements can be done using the laser method. Therefore the laser method is a complementary method to the particle method and it is not meant to replace it. The webinar also shows a few case studies of laser SEE testing of electronic components as examples.
Webinar Description: Space-born instruments carry many electronic devices including micro-processors, registers in digital circuits, etc. If a charged or an uncharged particle from space, strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect the electronic devices against this danger . Although testing in particle accelerator facilities produces absolute results for dosage of damage threshold, the process is expensive and can be done only in very localized test centers. The optical testing using near IR pulsed lasers of pico-second pulse width and pico/nano joule pulse energy is much easier to set up and can be done at any location. The laser technique can focus on the device with submicron resolution. The optical method is unable to measure the absolute upset threshold but the laser upset threshold can be compared with the ion beam upset threshold. It is assumed that the relative differences remain the same throughout the measurements and hence all subsequent measurements can be done with the pulsed laser. Although the optical method is compared to the radiation method, it is necessary to emphasize that it is not meant to replace it. Instead, the optical method is meant to be complementary to the radiation method.
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