Webinar Level 1 - Introducing Laser Testing of Single Event Effects(SEE)
08/22/2018 14:00 to 08/22/2018 15:00 (America/Montreal)
Webinar Description: Space-born instruments carry many electronic devices including micro-processors, registers in digital circuits, etc. If a charged or an uncharged particle from space, strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect the electronic devices against this danger . Although testing in particle accelerator facilities produces absolute results for dosage of damage threshold, the process is expensive and can be done only in very localized test centers. The optical testing using near IR pulsed lasers of pico-second pulse width and pico/nano joule pulse energy is much easier to set up and can be done at any location. The laser technique can focus on the device with submicron resolution. The optical method is unable to measure the absolute upset threshold but the laser upset threshold can be compared with the ion beam upset threshold. It is assumed that the relative differences remain the same throughout the measurements and hence all subsequent measurements can be done with the pulsed laser. Although the optical method is compared to the radiation method, it is necessary to emphasize that it is not meant to replace it. Instead, the optical method is meant to be complementary to the radiation method.
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