Webinar Level 1 - Introducing Laser Testing of Single Events Effects(SEE)

06/27/2018 14:00 to 06/27/2018 15:00 (America/Montreal)

Gatineau, Canada

Ticket Type End of Registration Price Quantity
Registration
Unlimited Free

  


  Host: Rez Mani did a M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a PhD in satellite optical instrumentation from York University. After working in industry for 10 years where he worked in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.

Webinar Description: Space-born instruments carry many electronic components such as FPGAs, ADCs, shift registers, SRAMs, DRAMs operation amplifiers, etc. If a space particle strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for the cross section of the SEE, it is expensive and can only be done in localized test centers. The laser testing of SEE using pulsed lasers of typically nano-Joules pulse energy is much easier to set up and can be done at any location. The laser beam can be focused on the Device Under Test (DUT) using a microscope objective to a spot of the order of few microns and probe different regions of the device with high resolution for occurrence of SEE. Although the absolute cross sections cannot be measured using the laser testing technique, it is assumed that the relative differences between the particle method and the laser method remain the same. Once the calibration is done in a particle testing facility, all the subsequent measurements can be done using the laser method. Therefore the laser method is a complementary method to the particle method and it is not meant to replace it. The webinar also shows a few case studies of laser SEE testing of electronic components as examples. 

Once you are registered you will be receiving a Gotomeeting or webex link and code to get in the webinar, stay tuned!  If you have any questions feel free to email ricky@alliedscientificpro.com.

Host Rez Mani did his PhD from York University in 2001 in satellite spectroscopic instrumentation. He worked in the industry for nearly 9 years, during which he participated in many optical, laser and spectroscopic projects where he used many different types of high power lasers such as Nd:YAG, CO2 and Ti:Sapphire.  He returned to York University in 2011 as a researcher and a contract faculty. He currently teaches the course "Atmospheric Pollution" for the department of Natural Science at York University. He has also been collaborating with Allied Scientific Pro as a consultant for more than 6 years.

Webinar Description: 
Space-born instruments carry many electronic devices including micro-processors, registers in digital circuits, etc. If a charged or an uncharged particle from space, strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. Testing of electronic circuits prior to space launching for radiation hardness   is crucial to protect the electronic devices against this danger . Although testing in particle accelerator facilities produces absolute results for dosage of damage threshold, the process is expensive and can be done only in very localized test centers. The optical testing using near IR pulsed lasers of pico-second  pulse width and pico/nano joule pulse energy is much easier to set up and can be done at any location. The laser technique can focus on the device with submicron resolution. The optical method is unable to measure the absolute upset threshold but the laser upset threshold can be compared with the ion beam upset threshold. It is assumed that the relative differences remain the same throughout the  measurements and hence all subsequent measurements can be done with the pulsed laser. Although the optical method is compared to the radiation method, it is necessary to emphasize that it is not meant to replace it. Instead, the optical method is meant to be complementary to the radiation method.


Once you are registered you will be receiving a Gotomeeting or webex link and code to get in the webinar, stay tuned! If you have any questions feel free to email ben@alliedscientificpro.com.

Getting smarter together!

ASP Team

Where

Allied Scientific Pro
815 Boulevard la Carriere, Office 203,
    Gatineau QC J8Y 6T4
    Canada
+1-800-253-4107
+1-(866) 526-4086

When

From 06/27/2018 14:00
To 06/27/2018 15:00

Organizer

Allied Scientific Pro
+1-800-253-4107
+1-(866) 526-4086

Social Stream

Participate on Twitter

Find out what people see and say about this event, and join the conversation.

Use this tag: #alliedscientificpro