Webinar Level 1 - Introducing Laser Testing of Single Events Effects(SEE)
06/27/2018 14:00 to 06/27/2018 15:00 (America/Montreal)
Host: Rez Mani did an M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This was followed by a Ph.D. in Earth and Space Science focused on satellite optical instrumentation from York University in Toronto, Ontario. After working in the industry for 10 years, where he participated in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.
Webinar Description: The webinar gives an introduction to laser ablation with particular emphasis on laser cleaning application. The pros and cons of using laser cleaning as compared to other cleaning methods are described. The parameters of importance as far as the laser and the materials to be worked on are considered. The 100 Watt, 200 Watt and 500 Watt laser cleaning systems offered by Allied Scientific Pro are discussed. Finally, a few examples of laser cleaning are given including video demonstrations of Allied Scientific Pro’s 100 Watt laser cleaning system in a nuclear decontamination facility and robotic controlled operations.
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Webinar Description: Space-born instruments carry many electronic devices including micro-processors, registers in digital circuits, etc. If a charged or an uncharged particle from space, strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. Testing of electronic circuits prior to space launching for radiation hardness is crucial to protect the electronic devices against this danger . Although testing in particle accelerator facilities produces absolute results for dosage of damage threshold, the process is expensive and can be done only in very localized test centers. The optical testing using near IR pulsed lasers of pico-second pulse width and pico/nano joule pulse energy is much easier to set up and can be done at any location. The laser technique can focus on the device with submicron resolution. The optical method is unable to measure the absolute upset threshold but the laser upset threshold can be compared with the ion beam upset threshold. It is assumed that the relative differences remain the same throughout the measurements and hence all subsequent measurements can be done with the pulsed laser. Although the optical method is compared to the radiation method, it is necessary to emphasize that it is not meant to replace it. Instead, the optical method is meant to be complementary to the radiation method.
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