Spectroscopic Ellipsometer (& optional mapping stage)

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  • SE-R&D with motorized Auto-Focus for standard ellipsometry
  • SE-SEMI with motorized Auto-Focus and X-Y motorized stages for increased measurement speed and accuracy
  • DWE with dual laser wavelength for PV as a drastic improvement on SWE
  • Thickness (Å): ±10 (Si)

0.0 USD

US$ 0.00

In stock, CIF your Country 1 Year Extended Warranty

Allied Scientific Pro from Taipei, Taiwan (R.O.C.), has teamed with a major testing equipment company to market their Spectroscopic Ellipsometers and Spectroscopic Reflectometers in  both America and Europe. We offer three major models:
  • SE-R&D with motorized Auto-Focus for standard ellipsometry 
  • SE-SEMI with motorized Auto-Focus and X-Y motorized stages for increased measurement speed and accuracy
  • DWE with dual laser wavelength for PV as a drastic improvement on SWE. 
All ellipsometers are equipped with state of the art software allowing remote connection from anywhere in the world. You can send us your sample for measurement and use the ellipsometer's software in your lab to verify the quality of both our hardware and software. You will be able to directly control the ellipsometer on your computer and also view the whole procedure via webcam live. Please contact us for more information.
 

 

 
 

Below are specifications and an experimental comparison of our SE-SEMI and a competitor's machine.

Try before you buy  

Ellipsometer Specifications

 
RadiTech ellipsometers are all high quality, precision engineered scientific instruments. Listed below are their technical specifications. Please refer to each machine's brochure, or send us an email for more details and information.
 
Model RadiTech SE R&D RadiTech SE-SEMI RadiTech DWE
Min. Wavelength (nm) 335 335 635
Max. Wavelength (nm) 1080 1050 795
Angle of Incidence 60° - 90° 60° - 90° 70°
Sample Size (mm) 204 300 204
Sample Size (in) 8.03 11.81 8.03
Min. Measuring Time (s) <3 <3 <6
Hi-Res Measuring Time (s) 10 10 6
Minimum Spot Size (µm) 85 x 190 85 x 190 30
CCD Resolution (nm) 1.4 1.4 N/A
Accuracy Values:      
Thickness (Å) ±10 (Si) ±10 (Si) ±10 (Si)
Refractive Index ± 0.01 @ 632.8 nm ± 0.01 @ 632.8 nm ± 0.01 @ 632.8 nm
Repeatability Values:      
Thickness (Å) ±5 ±5 ±3
Refractive Index ± 0.005 @ 632.8 nm ± 0.005 @ 632.8 nm ± 0.002 (635 nm

 

Sample Analysis for Customer

Earlier this year, a customer requested their own samples to be measured on two machines and the results compared. The first instrument is that of Company-S, one of our competitors, and the other is our own SE-SEMI. The results below demonstrate how the SE-SEMI obtained results normally within Angstroms of our competitors but at just a fraction of the price. Upon receiving these results, this customer purchased our ellipsometer. We will be more than willing to perform the same service for your laboratory free of charge.

 

Spectroscopic Ellipsometer (& optional mapping stage)

Spectroscopic Ellipsometer (& optional mapping stage)


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