Allied Scientific Pro has partnered with a factory in Asia that builds an InGaAs 2D array camera system. We are responsible for the sales and distribution of this product in America and Europe. ASP-SWIR-320DE3 is a short-wavelength infrared (SWIR) high-performance camera.
The camera consists of Indium Gallium Arsenide (InGaAs) Focal Plane Array (FPA) built on a Readout Integrated Circuit (ROIC).The FPA is a 320 x 256 matrix array of detector that is sensitive in the 0.9 to 1.7 ?m wavelength range. The camera’s signal processing electronics control the FPA, create timing and bias signals, perform analog-to-digital conversion, non-uniformity correction, replace bad pixels, and automatically control the brightness and contrast of the display video.
A real-time, 30 Hz, 12 bit digital data stream is the camera’s standard output format. It is also capable of being synchronized to an external RS-170 composite synchronization signal. The camera operates on a single power input of 12 V DC, which is provided by an external power supply that plugs into a wall socket. The camera can be controlled through the IEEE 1394 interface.
- ASP-SWIR-320DE3 is a short-wavelength infrared (SWIR) high-performance camera.
- Indium Gallium Arsenide (InGaAs) Focal Plane Array (FPA)
- Readout Integrated Circuit (ROIC).
- FPA is a 320 x 256 matrix array of detector
- 0.9nm to 1.7 nm
- Free Shipping
- Export licence easy to get
- Low cost
- Exportable around the world, none ITAR
- Made in Asia
- Spectral Domain OCT imaging
- CIGS solar cells inspection
- Laser Beam Profiling
- Plastic type sorting
- Semiconductor Inspection
- Solar Cell Inspection
- Solar Panel Inspection
- Machine Vision
- Military Vision System
- Food Inspection
- NIR Imaging
- Aircraft de-icing inspection
- Thermal imaging of hot objects (in the 200°C to 800°C range)
- On-line process control
- Medical applications
- Paper pulp processing
- Hyperspectral imaging
- Vision enhancement (automotive or airborne applications)
- Optical Coherence Tomography
Application Note - Solar Cell inspection
Our SWIR camera is fully capable of measuring solar cells to inspect for cell faliure and degradation over time.Below are two photos showing a standard Si-Poly inspection setup. To examine a solar cell, the cell is reverse biased and made electroluminescent (EL). As silicon has a band gap around 1.1 eV, an SWIR measurement system can be used to examine the cell's structure. This also applies for cells made of CIGS thin films.
|Pixel Size||30x30 microns|
|PC interface||IEEE1394 (Firewire)|
Hank Mayfield on 03/19/2016 00:16:18
I got this camera 1 week ago. This is a good camera with a very low cost. This is a very good deal for the quality of this camera. I'm suprised about the quality for this price. i recommend this product.